2012
DOI: 10.5923/j.ajms.20120204.02
|View full text |Cite
|
Sign up to set email alerts
|

Analysis for Parallel Repairable System with Degradation Facility

Abstract: This paper presents a mathematical model for performing availability and reliability analysis of a parallel repairable system consisting of n identical components with degradation facility and common-cause failures. In addition, system repair time is assumed to be arbitrarily distributed. Markov and supplementary variable techniques are used to develop equations for the model. As an illustration, system of four-identical/repairable components is analysed.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2016
2016
2018
2018

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 8 publications
0
2
0
Order By: Relevance
“…El-Damcese and Temraz [11] presented a mathematical model for performing availability and reliability analysis of a parallel repairable system consisting of n identical components with degradation facility and common-cause failures.…”
Section: Introductionmentioning
confidence: 99%
“…El-Damcese and Temraz [11] presented a mathematical model for performing availability and reliability analysis of a parallel repairable system consisting of n identical components with degradation facility and common-cause failures.…”
Section: Introductionmentioning
confidence: 99%
“…A considerable research with regard system availability has gained importance results of it’s steady state system availability, this has been observed in El-Damcese and Temraz ( 2012 , 2010 ). In practical applications, researchers (engineers) are more concerned in it which is expressed as, This show that the limit exists and estimates the extent by which the system hopes to be to exist after it has been worked for a long time and it is a vital measure performance of repairable system as defined in Bieth et al.…”
Section: Introductionmentioning
confidence: 99%