Analysis of aluminium-based ceramic powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a tungsten coil and slurry sampling

Study of the Simultaneous Determination of Different Volatile Elements in High Purity Zirconium Dioxide by In situ Matrix Removal and ETV-ICP-MS

“…As a basic substance for the production of advanced functional and structural materials, zirconium dioxide powder has attracted considerable practical interest due to its variety of applications ranging from sensors, insulators, coatings, solid electrolytes for fuel cells, piezoelectric or electro-optic devices, catalysts and engine parts to stationary phases in liquid chromatography (1)(2)(3). Several investigations show that the desired properties and applications of ZrO 2 may be strongly influenced by the addition of minor as well as trace elements (4,5). Therefore, it is essential to develop a simple, rapid, sensitive, and accurate method with minimum chemical pretreatment for the determination of trace elements in high purity ZrO 2 .…”

Use of In situ Matrix Removal for the Determination of the Volatile Elements Pb, Cd, and Zn in High Purity Tantalum Pentaoxide by ETV-ICP-MS

“…Tantalum pentaoxide (Ta 2 O 5 ) is an interesting basic substance for the production of advanced materials used in various technological fields owing to its excellent physical, chemical, and electrical characteristics (1)(2)(3). Several investigations have shown that any trace impurities in the advanced materials strongly influence the quality of products (4)(5)(6)(7). Accodingly, there is a need for methods allowing precise and accurate determination of a large number of impurity elements in Ta 2 O 5 powders.…”

Determination of Trace Rare Earth Impurities in Tantalum Pentaoxide by Electrothermal Vaporization ICP-MS Using in situ Volatilization for Matrix Removal

“…As a basic substance for advanced functional and structural materials, tantalum pentaoxide is widely used in the electrical, mechanical, steel, optical, aviation, and semiconductor industries owing to its excellent properties (1,2). The properties and applications of high purity materials in the hightech fields depend not only on the characteristics of the basic substances, but also on the purity of the compounds (3,4). Thus, the development of a rapid, sensitive, accurate, and direct method for the determination of trace impurities in high purity Ta 2 O 5 is an important research topic.…”