Abstract:In semiconductor manufacturing processes, it is important that the SiO2 isolation films around aluminum connection lines have flat surfaces in order to produce the multi-layered connection lines used in high-density devices. In this paper, we analyzed transient changes, in the thickness distributions of a liquid-SOG (Spin-on-Glass) film on a two-dimensional grooved substrate during the evaporative shrinking process. The flow due to surface tension of the shrinking liquid film was calculated. Since the film is … Show more
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