Analysis of electromagnetic behaviors induced by contact failure in electrical connectors

Abstract

Electrical connectors are widely used in electrical devices as an interconnect element and their reliability is a critical factor in device performance. However, there are multiple factors that may lead to poor reliability. These include contact failure induced by temperature and humidity, vibration, and atmospheric contamination, which may induce deterioration of the transmitted signal and leakage of electromagnetic energy. In the current work, the contact failure characteristics of a specific connector are investigated through measurement and analysis of high frequency parameters and spectrums. Based on transmission line theory and electrical contact theory, an equivalent model was developed to explore the effect of contact failure on high frequency parameters. Experiments were conducted using a network analyzer, signal generator, signal analyzer, and H‐field probe. The high frequency parameters were measured and compared with the calculated values, with consistent results. The leakage spectrums were measured with an H‐field probe for a variety of input signal amplitudes and frequencies and loose contact conditions. The results indicate that leakage increases with higher frequency and greater input signal amplitude.

Impact of impedance compensation structure in coaxial‐microstrip transition section on near‐field radiation

“…Considerable research studies have also been conducted to study the electromagnetic compatibility of micro-electronic interconnection using numerical calculation, [19][20][21][22] full-wave simulation, 23 and measurement. 24 Rogard et al 19 calculated the radiation emission of microstrip line using transmission-line theory and farfield Green's functions.…”

“…Yuan et al 22 simulated the radiation electric field of the circuit board with failed ground solder balls in the BGA package and studied the effect of ground solder ball failure on the amplitude of the near electric field leakage spectrum in the BGA package. Li et al 23 measured the leakage spectrum of the electric connector with loose contact.The comparison with previous literature is shown in Table 1.…”

Time to Event Analysis for Failure Causes in Electrical Power Distribution Systems

“…As a consequence, the study of DS failures is a current concern of researches, public agents, and society, in order to enhance the reliability and resilience of DSs (Zio, 2009). The leading causes of failures in DSs (Z lotecka and Sroka, 2018) (Sroka and Z lotecka, 2019) are accidents with animals (Sahai and Pahwa, 2006) or vegetation (Radmer et al, 2002), weather events (Konal et al, 2018) (Pahwa, 2007), load transfer (Rodriguez-Garcia et al, 2019), device failures (Li et al, 2019) and rare events like terrorism, vandalism and cyber-attacks (Ni and Li, 2019). Therefore, several factors may be associated with these failures, from equipment failure to vehicle accidents colliding with network elements, and for a better understanding of them, a separation of these failures into groups (bringing together similar threats or causes) may be interesting.…”