2015
DOI: 10.1007/s00339-014-8841-1
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Analysis of electron beam-induced effect on electrical switching properties of glass chalcogenide GeTe thin films through Raman spectroscopy

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Cited by 8 publications
(5 citation statements)
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“…Figure 2a and b show the normalized Raman spectra of as-deposited and annealed GeTe films, respectively. The results are in good agreement with the literatures [27,28]. There were three distinctive bands between 100 and 300 cm −1 as shown in Fig.…”
Section: Resultssupporting
confidence: 92%
“…Figure 2a and b show the normalized Raman spectra of as-deposited and annealed GeTe films, respectively. The results are in good agreement with the literatures [27,28]. There were three distinctive bands between 100 and 300 cm −1 as shown in Fig.…”
Section: Resultssupporting
confidence: 92%
“…1 (g) shows the line profiles of the lattice fringes shown in Fig Raman spectroscopy was performed to study the structure of the GeTe films before and after annealing using a Renishaw inVia Raman microscope equipped with an argon-ion laser operating at an excitation wavelength of 514 nm. [27,28]. There were three distinctive bands between 100 and 300 cm -1 as shown in Fig.…”
Section: Resultsmentioning
confidence: 91%
“…The two characteristic peaks, A and B, originated from the Ge-Te vibration; the former among these is the double-degenerate E symmetry transverse/longitudinal optical modes, and the latter is the A 1 symmetry transverse optical mode. [36][37][38][39] Peak C is due to the long-range inter- actions between crystalline Te, and peak D is triggered by the vibrational density of states of the long Te chains in disorder. 37,40 Peak E may be assigned to the antisymmetric stretching mode of the GeTe 4 tetrahedra.…”
Section: Resultsmentioning
confidence: 99%