2014
DOI: 10.1109/temc.2013.2278208
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Analysis of High Intensity Radiated Field Coupling into Aircraft Using the Method of Moments

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Cited by 25 publications
(7 citation statements)
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“…Case Study of Evektor VUT 100 HIRF Transfer Functions 1) Background: During the HIRF-SE research project [4] on virtual assessment of an aircraft internal EM environment, a method of moments (MoM) model of the VUT 100 was established [5] and comparisons of numerical results to measurements were performed. The application of a suitable MoM tool and approach was described in [6] and is applied here.…”
Section: B Hirf Transfer Functions In Civil Aviationmentioning
confidence: 99%
“…Case Study of Evektor VUT 100 HIRF Transfer Functions 1) Background: During the HIRF-SE research project [4] on virtual assessment of an aircraft internal EM environment, a method of moments (MoM) model of the VUT 100 was established [5] and comparisons of numerical results to measurements were performed. The application of a suitable MoM tool and approach was described in [6] and is applied here.…”
Section: B Hirf Transfer Functions In Civil Aviationmentioning
confidence: 99%
“…In the latter case, material varieties, uncontrolled parameters, and unintentional and unknown apertures need to be addressed. A discussion regarding the influence of these aspects on observables is outlined in [9].…”
Section: Classification Of the Challengementioning
confidence: 99%
“…All these tools have different modeling features and are run by various partners, the focal points being the whole geometrical and electrical description of the structure and the test setup and test procedure as in Section II. Due to electrically thick aluminum of the fuselage model, equal results were obtained for the deterministic codes when the aluminum structure was modeled as PEC [9].…”
Section: Applied Numerical Codesmentioning
confidence: 99%
“…[1][2][3][4][5] Especially for most sensitive components in optoelectronic systems, the wideband high-intensity radiated fields (HIRF) can be coupled into electronic equipment through optical windows due to their lack of electromagnetic reinforcement, resulting in detrimental influences on the stability and security of entire systems. [6,7] It is becoming increasingly difficult to ignore the corresponding EMI problem for optoelectronic systems.…”
mentioning
confidence: 99%