2012 Third International Conference on Intelligent Systems Modelling and Simulation 2012
DOI: 10.1109/isms.2012.132
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Analysis of Insulation Degradation in Epoxy Insulators Using Finite Element Method

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“…The simulation of electrical stresses due to water droplet and void has been conducted by a number of researchers [12][13][14]. It is known that electric field, admittance, and dielectric loss increase in a defective void insulator.…”
Section: Introductionmentioning
confidence: 99%
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“…The simulation of electrical stresses due to water droplet and void has been conducted by a number of researchers [12][13][14]. It is known that electric field, admittance, and dielectric loss increase in a defective void insulator.…”
Section: Introductionmentioning
confidence: 99%
“…It is known that electric field, admittance, and dielectric loss increase in a defective void insulator. When applied voltage is increased, the electric field intensity and current density loss would increase [12]. Tracking is more severe in defective samples, since the presence of surface contamination would increase the distortion of the electric field around the defect [14].…”
Section: Introductionmentioning
confidence: 99%