2011
DOI: 10.1063/1.3579233
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Analysis of Interstitial Elements in Niobium with Secondary Ion Mass Spectrometry (SIMS)

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Cited by 6 publications
(4 citation statements)
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“…Until recently (~2013) it was believed elements such as H, C, O and N were contaminants in SRF Nb to be avoided at high cost. [1,2,3,4,5] However, extensive evidence from cavity processing and testing indicates that introduction of small amounts of nitrogen and perhaps other interstitials can markedly improve energy efficiency, as characterized by quality factor Q 0 . [6,7,8,9,10] Difficulties encountered in current efforts to implement doping technology for the Linac Coherent Light Source II (LCLS II) suggest that deeper understanding is needed.…”
Section: Motivation For Work With Srf Materialsmentioning
confidence: 99%
“…Until recently (~2013) it was believed elements such as H, C, O and N were contaminants in SRF Nb to be avoided at high cost. [1,2,3,4,5] However, extensive evidence from cavity processing and testing indicates that introduction of small amounts of nitrogen and perhaps other interstitials can markedly improve energy efficiency, as characterized by quality factor Q 0 . [6,7,8,9,10] Difficulties encountered in current efforts to implement doping technology for the Linac Coherent Light Source II (LCLS II) suggest that deeper understanding is needed.…”
Section: Motivation For Work With Srf Materialsmentioning
confidence: 99%
“…Such experimental setups are expensive and appear to make these techniques relatively less commonly used for material characterization, but they are nevertheless commercially available. They are frequently used to verify, complement, and help quantify analyses made by other, more easily accessible methods (see, e.g., [37,52,61,83,84,92]).…”
Section: Nuclear Methodsmentioning
confidence: 99%
“…It is often combined with ERDA to get more complete information. Hydrogen analysis by NRA in metals has involved, e.g., Al/Cu/Ag/Au multilayers [101], Mg/Ni films [102], tantalum [107], Zr/Cu/Al glassy alloys [108], and deuterium in W and WO 3 layers [61], in niobium [84,92], and beryllium [110]. Concerning semiconductors, NRA has been used, e.g., to analyze hydrogen in a-Si:H [37,111], silicon carbide [112], and silicon nitride [113].…”
Section: Nuclear Reaction Analysis (Nra)mentioning
confidence: 99%
“…While the mechanism of NbC formation is still under investigation, combinations of strain and annealing reproducibly produced carbon and NbC clusters, more readily so in samples that received chemical polish. The affinity of carbon for linear defects [21,22] might be important for this process. The present study is novel in that high-resolution TEM and electron energy loss spectroscopy (EELS) have been coupled to study these excess C patches.…”
Section: Identification Of Niobium Carbide Inclusions By Tem and mentioning
confidence: 99%