1995
DOI: 10.1016/0921-4526(94)00655-f
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Analysis of multiple-scattering XAFS data using theoretical standards

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Cited by 764 publications
(580 citation statements)
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“…Data were acquired using a total electron yield detector [7]. Data analysis was performed using the UWXAFS software package [8] with phase and amplitude functions obtained from FEW [9]. In addition to the samples prepared for this study, an Fe sample (ball milled 16 hr.…”
Section: Methodsmentioning
confidence: 99%
“…Data were acquired using a total electron yield detector [7]. Data analysis was performed using the UWXAFS software package [8] with phase and amplitude functions obtained from FEW [9]. In addition to the samples prepared for this study, an Fe sample (ball milled 16 hr.…”
Section: Methodsmentioning
confidence: 99%
“…We thank Wilfried Brusten, Filip Beutels, Annick Cluyts, Ellen Poelmans, Karlien Duyssens, Jef Daems, and Jo van Laer for (Newville, 1995) as described in the program documentation (Newville, 1998)). …”
Section: Acknowledgementsmentioning
confidence: 99%
“…Today's state-of-the art EXAFS data analysis allows one to obtain precise atomic-scale information on the particle nanostructure for the absorbing element of interest. 27 Finally, a differentially pumped transmission electron microscope has been developed that operates at pressures up to 20 mbar and temperatures up to 900 K. [28][29][30] This instrument can be used to image the shape and shape changes of supported nanoparticles under reaction conditions. In combination with spatially resolved electron energy-loss spectroscopy (EELS), the composition and oxidation state of the nanoparticles and the support can be studied (see the article by Gai et al in this issue).…”
Section: In This Issuementioning
confidence: 99%