2018
DOI: 10.1016/j.jpcs.2018.06.015
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Analysis of optical dispersion parameters and electrochromic properties of manganese-doped Co3O4 dendrite structured thin films

Abstract: Analysis of optical dispersion parameters and electrochromic properties of manganese-doped Co 3 O 4 dendrite structured thin films.

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Cited by 37 publications
(16 citation statements)
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“…The zero-frequency refractive index (n0), also known as the deposited film's static refractive index, was estimated using [56]:…”
Section: Optical Characterizationmentioning
confidence: 99%
“…The zero-frequency refractive index (n0), also known as the deposited film's static refractive index, was estimated using [56]:…”
Section: Optical Characterizationmentioning
confidence: 99%
“…The average crystalline sizes are found to be as 40 nm and 48.73 nm for MnCo3O4 films deposited on copper and porous copper substrate respectively. The crystallite size found to be quite larger than previously reported literatures [38]. 2) FTIR Study: FTIR study was also evident for the structural confirmation of MnCo3O4 films.…”
Section: B Structural Analysis 1) X-ray Diffraction Technique (Xrd)mentioning
confidence: 52%
“…This is in good agreement with results in previous reports. 23,24 All results also show that a thin SEI layer has been formed, favoring ions transfer on the repeatedly cycled electrode. It can be seen from the rened XRD results that NGMO consists of Ge 4+ , Mn 2+ and Mn 3+ , and combined with XPS analysis, the results show that the valence states of Mn does not change for the discharged NGMO electrode.…”
mentioning
confidence: 84%