Analysis of oxygen on and in beryllium using 2 MeV helium ions

Musket, R. G.

doi:10.1016/s0168-583x(87)80228-8

Nuclear Instruments and Methods in Physics Research Section B:

1987

DOI: 10.1016/s0168-583x(87)80228-8

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Analysis of oxygen on and in beryllium using 2 MeV helium ions

R. G. Musket¹

Abstract: Analysis of oxygen on beryllium can be routinely performed using heliumion backscattering (RBS). However, determination of the bulk oxygen concen tration by this technique is limited to about 350 atomic parts per million (appm). We have performed simultaneous RBS and particle-induced X-ray emission (PIXE) measurements to improve the detection limit for bulk oxygen.The RBS measurements allowed determination of the surface oxygen before and after in situ sputter cleaning by argon ions in an ultra-high-vacuum sys… Show more

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Cited by 8 publications

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Secondary electron emission characteristics of oxidized beryllium cathodes

Ritz

Thomas

Gibson

et al. 1988

Surface & Interface Analysis

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Oxidized beryllium surfaces are used in a number of microwave crossed-field amplifier (CFA) tubes as secondary electron emission cold cathodes. During operation the cathode surface is subjected to electron and ion bombardment in a complex process which produces both erosion and replenishment of the oxide surface, in addition to a significant build-up of amorphous carbon. The result is a general degradation of tube performance. Special techniques were developed to open an evacuated tube and transfer the cathode to a UHV surface analysis system with minimal contamination from the atmosphere. Three CFA tubes with various histories of operation were examined and measurements made of the secondary electron emission (delta), first crossover, voltage a t delta maximum, and the surface chemical composition by AES at several points on each cathode. Significant differences were found which reflected their number of hours of operation, as well as variations in manufacturing procedures. A generalized linear correlation between secondary electron emission and the surface carbon atomic fraction was obtained when the data for all the tubes was combined and analyzed. The deleterious effects of carbon in operated CFA tubes were confirmed and suggest that reduction of potential sources of carbon contamination in the tube during manufacture, processing, and operation should improve overall performance.

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Secondary electron emission characteristics of oxidized beryllium cathodes

Ritz

Thomas

Gibson

et al. 1988

Surface & Interface Analysis

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X‐ray fluorescence analysis for oxygen on and in materials

Musket

1990

X-Ray Spectrometry

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Quantitative analysis for oxygen on the surface and in the bulk of materials has been demonstrated using an energy-dispersive x-ray fluorescence system. The system consists of an A1 K x-ray source, an ultra-thin-windowed Si(Li) detector and an ion gun for sputter cleaning. Sputter cleaning was required to distinguish between surface and bulk 0 K x-ray signals. Since beryllium has one of the lowest mass absorption coefiicients for 0 K x-rays, calculations and extensive measurements were made for oxygen on and in beryllium. The 3-u detection limits were 0.22 om of Be0 on beryllium and 98 atomic parts per million (appm) of oxygen in beryllium. Measurements of surface oxides on other materials indicated detection limits of 1.9 nm of SiO, on silicon and 2.0 nm of Ta,O, on tantalum. The corresponding detection limits for oxygen in silicon and tantalum were 0.39 and 4.3 at.-%, respectively.

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Analysis by nuclear reactions and activation

Bujdosó

1989

Journal of Radioanalytical and Nuclear Chemistry, Articles

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Analysis of oxygen on and in beryllium using 2 MeV helium ions

Cited by 8 publications

References 8 publications

Secondary electron emission characteristics of oxidized beryllium cathodes

Secondary electron emission characteristics of oxidized beryllium cathodes

X‐ray fluorescence analysis for oxygen on and in materials

Analysis by nuclear reactions and activation

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