2024
DOI: 10.3934/math.20241546
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Analysis of reliability index $ \mathfrak{R} = P(Y < X) $ for newly extended xgamma progressively first-failure censored samples with applications

Refah Alotaibi,
Mazen Nassar,
Zareen A. Khan
et al.

Abstract: <p>The stress-strength index measures the likelihood that a system's strength exceeds its stress. This study focuses on deducting the stress-strength index, denoted as $ \mathfrak{R} = P(Y &lt; X) $, where the strength $ (X) $ and stress $ (Y) $ are independent random variables following new extended xgamma distributions. Inferences are made based on progressively first-failure censored samples. Both maximum likelihood and Bayesian estimation approaches, including point and interval estimations, are … Show more

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