Analysis of
            <scp>two‐dimensional</scp>
            multipactor model for ferrite circulator junction

Ren, Haiping; Xie, Yongjun

doi:10.1002/mmce.23002

Int J RF Mic Comp-Aid Eng

2021

DOI: 10.1002/mmce.23002

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Analysis of two‐dimensional multipactor model for ferrite circulator junction

Haiping Ren¹,

Yongjun Xie²

Abstract: Based on the Vaughan model, a simplified two-dimensional multipactor model of the circulator junction is established in this paper. It consists of two parallel metal plates and a dielectric plate that is vertical to the metal plate. A radio frequency electric field is applied between the two metal plates, and an electro-

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Cited by 2 publications

References 32 publications

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Quantitative analysis of multipactor threshold sensitivity to secondary emission yield of microwave devices

Lin

Xia

et al. 2023

Physics of Plasmas

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Multipactor occurrence essentially depends on the secondary emission property of the surface material, which is, thus, the requisite input for multipactor threshold prediction using the numerical and theoretical approaches. However, secondary emission yield (SEY) deviation in experimental measurements inevitably leads to uncertainty error in multipactor threshold prediction. Therefore, this paper presents a thorough quantitative analysis of multipactor threshold sensitivity to SEY including the effect of the device geometry, the multipactor mode, and the material type. Based on the statistical modeling, multipactor threshold voltages with respect to the SEY variation in critical SEY regions are calculated for both the parallel plates and coaxial lines with different multipactor orders and typical materials. Furthermore, the distribution of electron impact energy is also obtained to elucidate the underlying mechanism for the relevant sensitivity discrepancy. The result reveals that multipactor threshold is generally most sensitive to the energy region below the first crossover energy ( E1), and this is changed to higher energies below the corresponding energy to the SEY maximum ( Em) with a change in the device geometry, multipactor mode, or coating material. It is also found that the magnitude relation of the threshold sensitivity between different regions is radically determined with the distribution of electron impact energy, and the SEY variation close to Em merely affects the threshold result with a high multipactor order. This research provides useful reference for properly determining the threshold margin from the measurement error of SEY, thus promoting the performance optimization with multipactor prevention in the practical application of microwave devices.

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Quantitative analysis of multipactor threshold sensitivity to secondary emission yield of microwave devices

Lin

Xia

et al. 2023

Physics of Plasmas

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Effect analysis of spatial discrepancy of secondary emission yield on multipactor formation

Lin,

Zhong,

Chen

et al. 2023

Physics of Plasmas

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Spatial discrepancy of secondary emission yield (SEY) is probably exacerbated by unexpected surface contamination or imperfect surface treatments for SEY suppression, which accordingly provokes increased multipactor risk in microwave devices. In this paper, an improved 2D2V nonstationary statistical modeling for multipactor of parallel plates capable of regarding all electron impacts and electron exchange at the periodic boundaries is developed to investigate the effect of this spatial SEY discrepancy on multipactor formation in microwave devices. The comparison with the 1D2V statistical modeling results, which is valid for the parallel-plate multipactor, proves the accuracy of this improved 2D2V statistical modeling and the necessity of appropriate boundary setting in multipactor analysis with spatial SEY variation. The modeling results also reveal that the multipactor establishment is dominated by the electron multiplication and the electron overflow in the high-SEY region, thus making the multipactor threshold strongly dependent on both the SEY property and the dimension of the region. Electron multiplication can be fully sustained in the high-SEY region when its size exceeds a critical dimension, which satisfies a scaling law (the sustaining dimension is proportional to the gap with the product of the RF frequency and the gap kept constant) and varies with the involved multipactor mode. This research will help in evaluating accidental multipactor risk caused by the surface contamination and the efficiency of multipactor prevention via applying surface treatments for SEY suppression to accessible regions.

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Analysis of two‐dimensional multipactor model for ferrite circulator junction

Cited by 2 publications

References 32 publications

Quantitative analysis of multipactor threshold sensitivity to secondary emission yield of microwave devices

Quantitative analysis of multipactor threshold sensitivity to secondary emission yield of microwave devices

Effect analysis of spatial discrepancy of secondary emission yield on multipactor formation

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