2010
DOI: 10.1109/tns.2010.2043686
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Analysis of SET Propagation in Flash-Based FPGAs by Means of Electrical Pulse Injection

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Cited by 35 publications
(18 citation statements)
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“…Previous work of accurate SET pulse electrical injection shows a strong SET pulse-width modulation when SET pulse traverses logic gates [8]. In addition, it has been concluded that the SET pulse width at the input of the storage element is strictly dependent on the propagation and type of traversed logic gates [9]. This SET pulse width is also dependent on the routing structure of the used technology [8].…”
Section: Related Workmentioning
confidence: 95%
“…Previous work of accurate SET pulse electrical injection shows a strong SET pulse-width modulation when SET pulse traverses logic gates [8]. In addition, it has been concluded that the SET pulse width at the input of the storage element is strictly dependent on the propagation and type of traversed logic gates [9]. This SET pulse width is also dependent on the routing structure of the used technology [8].…”
Section: Related Workmentioning
confidence: 95%
“…New insight on flash-based FPGA is investigated in [4]. A new methodology for effectively measuring the width of radiation-induced transient faults has been proposed and developed in [5] [6]. However, they are not effective for a representative example of realistic designs.…”
Section: Related Workmentioning
confidence: 99%
“…Some organizations have also designed fault emulation systems that emulate SETs in FPGAs [7], [54]- [56]. In [57], electronic pulses are inserted in the circuit using gate-level instrumentation of the circuit. The instrumentation circuit is connected both to the input pads and the circuit, so that an external signal generator can be used to drive an input into the instrumentation circuit, which can translate the signal into a pulse that is driven into the user circuit.…”
Section: Set Fault Emulation Systemsmentioning
confidence: 99%