2021 2nd International Conference for Emerging Technology (INCET) 2021
DOI: 10.1109/incet51464.2021.9456340
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of Short Channel Effects for Junction Less MOSFET With Metal Gates and High-κ Spacers

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(1 citation statement)
references
References 11 publications
0
1
0
Order By: Relevance
“…In addition, the DIBL of HfO2-based devices was three times higher than that of SiO2-based devices. Last but not least, the IOFF of the HfO2-based JLFET was lower, which resulted in the ON-OFF current ratio (ION /IOFF) of 10 6 , much higher than that of a normal JLFET [8].…”
Section: High-κ Materialsmentioning
confidence: 99%
“…In addition, the DIBL of HfO2-based devices was three times higher than that of SiO2-based devices. Last but not least, the IOFF of the HfO2-based JLFET was lower, which resulted in the ON-OFF current ratio (ION /IOFF) of 10 6 , much higher than that of a normal JLFET [8].…”
Section: High-κ Materialsmentioning
confidence: 99%