2025
DOI: 10.1016/j.engfailanal.2024.109092
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of short-circuit failure paths and causes of high-reliability tungsten-copper electrode gas discharge tubes

Hefei Cao,
Tongze Xin,
Congying Han
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 7 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?