Analysis of Single Event Effects on Embedded Processor

Azimi, Sarah; Sio, Corrado De; Rizzieri, Daniele; Sterpone, Luca

doi:10.3390/electronics10243160

Cited by 9 publications

(2 citation statements)

References 24 publications

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“…The increasing complexity in applications and tasks has pushed Soft-core processors to be one of the cores commonly implemented using the programmable logic of the FPGAs. A soft-core processor as an IP-Core provides an easy way to combine the flexibility granted by the software with the performance of dedicated hardware accelerations [2].…”

Section: Introductionmentioning

confidence: 99%

Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

et al. 2022

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The continuous scaling of electronic components has led to the development of high-performance microprocessors that are suitable even for safety-critical applications where radiation-induced errors such as Single Event Effects (SEEs) can have a significant impact on the performance and reliability of the system. This work is dedicated to investigating the reliability of systems based on programmable hardware and Real-time operating Systems (RTOS) in the presence of architectural faults induced by soft errors in the configuration memory of the programmable hardware. We performed a proton radiation test campaigned at PSI radiation facility to identify the fault model affecting the configuration memory of Xilinx Zynq-7020 reconfigurable AP-Soc Device. The identified fault model in terms of SEU and MBU clusters has been used to evaluate the impact of proton-induced faults on applications running within FreeRTOS on a Microblaze soft processor. A Single Event Multiple Upset fault model resulting from a proton test is presented, focusing on characteristics such as shape, size, and frequency of observed cluster of errors. We conduct two fault injection campaigns and analyze the results to assess the effect of cluster size on system reliability. Moreover, we discuss software exceptions caused by faults that can affect the hardware structure of the soft processor.

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Section: Introductionmentioning

confidence: 99%

Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

et al. 2022

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“…Transistors collect the ionized electron-hole pairs, which produce unwanted transient currents in circuit nodes [4,5]. These transient currents propagate along the circuit path and produce soft errors according to the circuit responses [6]. They may result in serious consequences to the entire chip, system, or even a spacecraft [7].…”

Section: Introductionmentioning

confidence: 99%

TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials

et al. 2022

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The heavy ion-induced sensitive area is an essential parameter for space application integrated circuits. Circuit Designers need it to evaluate and mitigate heavy ion-induced soft errors. However, it is hard to measure this parameter due to the lack of test structures and methods. In this paper, a test method called TAISAM was proposed to measure the heavy ion-induced sensitive area. TAISAM circuits were irradiated under the heavy ions. The measured sensitive areas are 1.75 μm2 and 1.00 μm2 with different LET values. TAISAM circuits are also used to investigate the layout structures that can affect the sensitive area. When the source region of the target transistor is floating, the heavy ion-induced sensitive area decreases by 28.5% for the target PMOS transistor while it increases by more than 28% for the target NMOS transistor. When the well contacts are added, the heavy ion-induced sensitive area decreases by more than 25% for the target PMOS transistor while it remains unchanged for the target NMOS transistor. Experimental results directly validate that the two structures significantly affect the heavy ion-induced sensitive area.

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On the Reliability of Real-Time Operating System on Embedded Soft Processor for Space Applications

Portaluri

Azimi

Sio

et al. 2022

Architecture of Computing Systems

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Analysis of Single Event Effects on Embedded Processor

Cited by 9 publications

References 24 publications

Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

Exploring the Impact of Soft Errors on the Reliability of Real-Time Embedded Operating Systems

TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials

On the Reliability of Real-Time Operating System on Embedded Soft Processor for Space Applications

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