2017 18th IEEE Latin American Test Symposium (LATS) 2017
DOI: 10.1109/latw.2017.7906772
|View full text |Cite
|
Sign up to set email alerts
|

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
2
0

Year Published

2017
2017
2024
2024

Publication Types

Select...
3
2
1

Relationship

1
5

Authors

Journals

citations
Cited by 13 publications
(2 citation statements)
references
References 7 publications
0
2
0
Order By: Relevance
“…For that reason, the FPGA hardware is flash-based, in our case the Microsemi ProASIC3e FPGA [34]. In this type of FPGA, the configuration memory is not affected by SEUs [52].…”
Section: Fig 5 Checkpoint Recovery Technique Scenariomentioning
confidence: 99%
“…For that reason, the FPGA hardware is flash-based, in our case the Microsemi ProASIC3e FPGA [34]. In this type of FPGA, the configuration memory is not affected by SEUs [52].…”
Section: Fig 5 Checkpoint Recovery Technique Scenariomentioning
confidence: 99%
“…The inconvenience of radiation applications is that most of the time, special designs or components modifications are required to bear certain ionising radiation doses and/or mitigate SEE errors [10], [154], [155], for example using Rad-Hard components. However, it is unusual to find COTS with specific radiation tolerant or resistance properties, and the inconvenience of non-COTS components is that they have a high cost and low availability, in addition to complex political and commercial treaties in some cases [156]. Sometimes this specific Rad-Hard technology can be limited and backward compared to COTS technology [146]; due to the constantly changing and evolving of COTS.…”
Section: Introductionmentioning
confidence: 99%