2013
DOI: 10.1016/j.ces.2013.08.007
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Analysis of smearing-out in contribution plot based fault isolation for Statistical Process Control

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Cited by 87 publications
(45 citation statements)
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“…Fault identification for batch processes-if even discussed-mostly occurs after fault detection via analysis of contribution plots, despite their suffering from fault smearing, which possibly leading to incorrect diagnosis [82,77]. A few exceptions exist, such MKLFDA, where fault detection and identification occur simultaneously [95].…”
Section: Introductionmentioning
confidence: 97%
“…Fault identification for batch processes-if even discussed-mostly occurs after fault detection via analysis of contribution plots, despite their suffering from fault smearing, which possibly leading to incorrect diagnosis [82,77]. A few exceptions exist, such MKLFDA, where fault detection and identification occur simultaneously [95].…”
Section: Introductionmentioning
confidence: 97%
“…From (6) and (8), it is clear that a vector w that maximizes J (w) is equal to calculating the generalized eigenvectors of the eigenvalue problem…”
Section: A Fault Degradation-oriented Discriminant Analysismentioning
confidence: 99%
“…They do not contain the key ingredient for full diagnosis and fault isolability: causality. This is why, when "inquired" about which variables are mostly contributing to a given change in the monitoring statistics (the purpose of contribution plot analysis), these methods are bound to put forward the set of variables that are correlated with the fault origin without distinguishing which variables are the cause of the fault and which variables are the result, leading to the well-known smearing-out effect; see more in references [8,[66][67][68][69][70]. This is a limiting feature of traditional "unstructured" approaches that can be circumvented by incorporating more causal-oriented structure or a priori process knowledge in IPM methodologies.…”
Section: From Unstructured To Structured Process Monitoringmentioning
confidence: 99%