Analysis of soft faults' mathematical model based on resistive-inductive model of internal noises in VLSI

Mandziy, Bohdan; Vasiltsov, I.V.; Bench, A.

doi:10.1109/tcset.2002.1015848

Modern Problems of Radio Engineering, Telecommunications and Computer Science (IEEE Cat. No.02EX542)

DOI: 10.1109/tcset.2002.1015848

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Analysis of soft faults' mathematical model based on resistive-inductive model of internal noises in VLSI

Bohdan Mandziy

I.V. Vasiltsov²,

A. Bench³

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Analysis of soft faults' mathematical model based on resistive-inductive model of internal noises in VLSI

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