2021
DOI: 10.1016/j.microrel.2021.114399
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Analysis of solder joint degradation and output power drop in silicon photovoltaic modules for reliability improvement

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Cited by 7 publications
(4 citation statements)
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“…Analytical models facilitate the study of particular degradation modes like PID and prediction of lifetimes under diverse conditions [41][42][43][44][45][46][47][48][49][50]. However, models are often constrained to specific parameters, limiting applicability across different environments and technologies [41].…”
Section: Discussionmentioning
confidence: 99%
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“…Analytical models facilitate the study of particular degradation modes like PID and prediction of lifetimes under diverse conditions [41][42][43][44][45][46][47][48][49][50]. However, models are often constrained to specific parameters, limiting applicability across different environments and technologies [41].…”
Section: Discussionmentioning
confidence: 99%
“…Bypass diodes in junction boxes limit reverse voltage and temperature in shaded cells [8,25,27,34]. IR analysis of temperature distribution and dust buildup can inform effective cleaning mechanisms [42].IR thermography is a crucial tool for early hotspot detection, which allows preventing permanent damage and power losses from cell overheating [36]. IR imaging further enables assessing dust accumulation impacts and developing optimized cleaning strategies [42].…”
Section: Infrared Thermography or Infrared Imaging (Ir) Methodsmentioning
confidence: 99%
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“…Ref. [31] used a new method for controlling the microgrid frequency with a drop control in a photovoltaic converter and battery, in which a low-voltage microgrid is considered to be multiple virtual microgrids. This strategy has improved the finetuning of the microgrid frequency.…”
Section: Introductionmentioning
confidence: 99%