1999
DOI: 10.1103/physrevb.60.14372
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Analysis of surface structures through determination of their composition using STM: Si(100)4×3-In and Si(111)4×1-In reconstructions

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Cited by 52 publications
(19 citation statements)
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“…The spatial distribution of forming clusters is random. With increasing In coverage, the number density of clusters increases, but their spatial distribution remains almost random [13,14]. This is clearly seen in Fig.…”
Section: B In/si(100)mentioning
confidence: 73%
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“…The spatial distribution of forming clusters is random. With increasing In coverage, the number density of clusters increases, but their spatial distribution remains almost random [13,14]. This is clearly seen in Fig.…”
Section: B In/si(100)mentioning
confidence: 73%
“…However, when the saturation In coverage of ∼0.5 ML is attained the clusters become arranged into the well-ordered 4×3 superlattice [13,14] as one can see in Fig. 1b.…”
Section: B In/si(100)mentioning
confidence: 91%
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“…Because of the highly anisotropic nature in atomic arrangement and surface electronic structure of the 4×1-In surface [20][21][22][23], we expected anisotropic epitaxial growth of metals on this surface. It will be interesting to compare the results with the growth on an isotropic substrate of Si(111)-7×7 clean surface.…”
Section: Introductionmentioning
confidence: 99%
“…14 Most recently, Saranin and co-workers 15 reported their results of absolute 0.75 ML indium coverage and 4 ð 1 Si substrate reconstruction based on new AES, STM and low-energy electron diffraction (LEED) data, and concluded that the indium row is three atoms wide with 1/2 ML Si atoms existing between the metal rows on the surface. Based on these empirical results there continues to be challenging issues: the registry of indium atoms on the Si(111) surface, the structure model and the saturation coverage of the indium induced 4 ð 1 surfaces are still controversial problems.…”
mentioning
confidence: 98%