2017
DOI: 10.4236/msce.2017.54002
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Analysis of Te and TeO<sub>2</sub> on CdZnTe Nuclear Detectors Treated with Hydrogen Bromide and Ammonium-Based Solutions

Abstract: Surface defects caused during cutting and polishing in the fabrication of cadmium zinc telluride (CdZnTe) nuclear detectors limit their spectral performance. Chemical treatments are often used to remove surface damages and defects. In this paper, we present the analysis of Te and TeO 2 species on the surfaces of CdZnTe nuclear detectors treated with hydrogen bromide and ammonium-based solutions. The CdZnTe wafers were chemo-mechanically polished in a mixture of hydrogen bromide in hydrogen peroxide and ethylen… Show more

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Cited by 4 publications
(3 citation statements)
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“…The high-resolution XPS spectra of the Te 3d are fit in Figure c. The peaks centered at 576.0 and 586.2 eV can be assigned to tetragonal TeO 2 . , The O 1s spectrum shows a peak centered at 530.3 eV (Figure S1), which is assigned to the binding energy of Te–O.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The high-resolution XPS spectra of the Te 3d are fit in Figure c. The peaks centered at 576.0 and 586.2 eV can be assigned to tetragonal TeO 2 . , The O 1s spectrum shows a peak centered at 530.3 eV (Figure S1), which is assigned to the binding energy of Te–O.…”
Section: Resultsmentioning
confidence: 99%
“…The peaks centered at 576.0 and 586.2 eV can be assigned to tetragonal TeO 2 . 38,39 The O 1s spectrum shows a peak centered at 530.3 eV (Figure S1), which is assigned to the binding energy of Te−O. SEM was utilized to confirm the unique morphologies of Te before and after thermal oxidization.…”
Section: ■ Experimental Sectionmentioning
confidence: 99%
“…These processes are used to remove surface defects that are left after the mechanical polishing of the wafers. The chemical treatment process involves passivation to make the wafer surfaces more chemically stable [4] [9] [10] [11].…”
Section: Introductionmentioning
confidence: 99%