2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) 2018
DOI: 10.1109/dft.2018.8602988
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Analysis of the Effects of Single Event Upsets (SEUs) on User Memory in FPGA Implemented Viterbi Decoders

Zhen Gao
1
,
Lina Yan
2
,
Jinhua Zhu
3
et al.
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