Analysis of the Impact of Artificial Networks in System-level EMC Tests

Gardella, Pablo; Mariani, Eduardo

doi:10.1109/emccompo52133.2022.9758596

2021 13th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo) 2022

DOI: 10.1109/emccompo52133.2022.9758596

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Analysis of the Impact of Artificial Networks in System-level EMC Tests

Pablo Gardella

Eduardo Mariani²

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2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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High-Fidelity S-Parameter Prediction Using Transfer Learning Based Encoder-Decoder Model

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Xu,

Qiu

et al. 2024

2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

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Analysis of the Impact of Artificial Networks in System-level EMC Tests

Cited by 1 publication

References 16 publications

High-Fidelity S-Parameter Prediction Using Transfer Learning Based Encoder-Decoder Model

High-Fidelity S-Parameter Prediction Using Transfer Learning Based Encoder-Decoder Model

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