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Diaz, Julia M.; Anders, S.; Zhou, Xian Yin; Moler, Edward J.; Kellar, S. A.; Hussain, Zahid

doi:10.1103/physrevb.64.125204

Cited by 78 publications

(63 citation statements)

References 60 publications

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“…can be used to determine the sp 3 content in undoped amorphous carbon films [20]. Extending this idea to doped films, we conclude that the sp 3 content decreases in the following order: 3at% > 5at% > 6at%.…”

Section: Resultsmentioning

confidence: 88%

“…Several absorption peaks around the C-K 1s edge have been identified [17][18][19][20]. Table I summarizes reported transitions and corresponding energies.…”

Section: Resultsmentioning

confidence: 99%

“…Plowing of the substrate can also explain the dependence of the COF on the Si content for high loads. [17][18][19] 286.8 1s → π * of sp 2 (C=O) [17,19] 287.8 1s → σ * of sp 3 (C-H) [17,19] 288.5 1s → π * (O=C-OH) [19] 288.8 Excitonic process (like in diamond) [18] 289 Resonance 1s → σ * of sp 3 (C-C) [17,20] 290 -310 1s → σ * of sp 3 (C-C) broadened because it is amorphous …”

Section: Discussionmentioning

confidence: 99%

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Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Monteiro¹,

Delplancke‐Ogletree²

2003

Surface and Coatings Technology

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Abstract:Non-hydrogenated DLC films (also referred as ta-C) have been extensively studied and are used for a variety of wear related applications. Alloying DLC with refractory metals and other elements have been shown to be promising techniques to overcome some of the problems associated with pure DLC, such as excessive level of intrinsic stresses and high-temperature stability. The microstructure of DLC:Me in general consists of crystalline metal carbides dispersed in a DLC matrix. In contrary, DLC:Si has an amorphous structure. We have used filtered cathodic arc to prepare DLC:Si up to 6% Si, and have characterized their structure and bonding using microscopy (TEM) and spectroscopy (XPS, NEXAFS). The effect of Si in changing the bonding configuration of the C network is discussed. The microstructure is then correlated to hardness and friction measured by nano-indentation and micro-wear.

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Section: Resultsmentioning

confidence: 88%

“…Several absorption peaks around the C-K 1s edge have been identified [17][18][19][20]. Table I summarizes reported transitions and corresponding energies.…”

Section: Resultsmentioning

confidence: 99%

Section: Discussionmentioning

confidence: 99%

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Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Monteiro¹,

Delplancke‐Ogletree²

2003

Surface and Coatings Technology

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“…Since the π*/σ* ratio depends on the angle of the impinging X-ray photons relative to the HOPG basal planes 58 , some authors have used other reference materials for quantification, such as fullerene films 32,68 , disordered forms of graphite (e.g., Ar + sputtered HOPG) 14,33,34 , and evaporated carbon 67 . The use of these materials for the quantitative evaluation of the carbon hybridization state from NEXAFS spectra will not be discussed in this work.…”

Section: Section I ð Methodology For the Quantitative Evaluation Of Tmentioning

confidence: 99%

“…As a consequence, some of the most powerful weapons in the materials characterization arsenal have been used to characterize these materials 11 , including Raman spectroscopy [11][12][13][14][15][16] , Xray photoelectron spectroscopy (XPS) [16][17][18][19][20][21][22][23][24][25][26] , Auger electron spectroscopy (AES, including X-ray induced AES (XAES)) 17,18,20,22,23,25,27,28 , near edge X-ray absorption fine structure (NEXAFS) spectroscopy 14,21,[29][30][31][32][33][34][35] , electron energy-loss spectroscopy (EELS) 15,[36][37][38] , Fourier-transform infrared spectroscopy 39 , nuclear magnetic resonance spectroscopy 40 , and X-ray reflectivity 15 . Among the surface-sensitive techniques, electron spectroscopies (XPS, AES, XAES, NEXAFS, and EELS) are widely used for the characterization of a-C materials.…”

Section: Introductionmentioning

confidence: 99%

Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

2016

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The characterization of the local bonding configuration of carbon in carbon-based materials is of paramount importance since the properties of such materials strongly depend on the distribution of carbon hybridization states, the local ordering, and the degree of hydrogenation. Carbon 1s near edge X-ray absorption fine structure (NEXAFS) spectroscopy is one of the most powerful techniques for gaining insights into the bonding configuration of near-surface carbon atoms. The common methodology for quantitatively evaluating the carbon hybridization state using C1s NEXAFS measurements, which is based on the analysis of the sample of interest and of a highly ordered pyrolytic graphite (HOPG) reference sample, was reviewed and critically assessed, noting that inconsistencies are found in the literature in applying this method. A theoretical rationale for the specific experimental conditions to be used for the acquisition of HOPG reference spectra is presented together with the potential sources of uncertainty and errors in the correctly computed fraction of sp 2 -bonded carbon. This provides a specific method for analyzing the distribution of carbon hybridization state using NEXAFS spectroscopy. As an illustrative example, a hydrogenated amorphous carbon film was analyzed using this method, and showed good agreement with X-ray photoelectron spectroscopy (which is surface sensitive).Furthermore, the results were consistent with analysis from Raman spectroscopy (which is not surface sensitive), indicating the absence of a structurally different near-surface region in this particular thin film material. The present work can assist surface scientists in the analysis of NEXAFS spectra for the accurate characterization of the structure of carbon-based materials.3

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The Role of Hydrogen in the Electronic Structure of Amorphous Carbon: An Electron Spectroscopy Study

Calliari¹,

Filippi²,

Laidani³

et al.

Topics in Applied Physics

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Analysis of theπandσbands of the x-ray absorption spectrum of amorphous carbon

Cited by 78 publications

References 60 publications

Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

The Role of Hydrogen in the Electronic Structure of Amorphous Carbon: An Electron Spectroscopy Study

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Analysis of theπ*andσ*bands of the x-ray absorption spectrum of amorphous carbon

Cited by 78 publications

References 60 publications

Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Investigation of non-hydrogenated DLC:Si prepared by cathodic arc

Quantitative Evaluation of the Carbon Hybridization State by Near Edge X-ray Absorption Fine Structure Spectroscopy

The Role of Hydrogen in the Electronic Structure of Amorphous Carbon: An Electron Spectroscopy Study

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Product

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Analysis of theπandσbands of the x-ray absorption spectrum of amorphous carbon