“…The hole and electron mobilities were measured by the SCLC model using ITO/MoOx/polymer blends/MoOx/Ag and ITO/ZnO/polymer blend/Al devices, respectively. [
49 ] Current–voltage measurements in the range of 0–10 V were obtained, and the results were fitted to a space‐charge limited function. The SCLC is described by
where ε 0 , ε , µ , V , L , and γ represent the permittivity of free space (8.85 × 10 −14 F cm −1 ), relative dielectric constant of the active layer (=3), mobility of charge carriers, potential across the device ( V = V applied − V bi − V r ), active layer thickness, and field‐activation factor, respectively.…”