1994
DOI: 10.1063/1.356043
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Analysis of the scanning electron microscope mirror image based on the dielectric surface microstructure

Abstract: This paper addresses hitherto unexplained phenomena associated with the electrostatic mirror technique, such as (i) the influence of the surface microstructural parameters of a polycrystalline dielectric (e.g., alumina) on mirror images, and (ii) the distortion of mirror images. The formation of a mirror image on an as-machined alumina surface was found to be nearly impossible, but on a polished specimen, possessing low surface damages, mirror images were easily formed. A smooth and low-damage surface seems to… Show more

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Cited by 10 publications
(7 citation statements)
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“…It produces the images by probing the specimen with a focused electron beam which scans across a rectangular area on top of the sample surface, and it has been vastly applied to characterising the nanometre surface morphology. [137][138][139][140] TEM has become a key tool to correlate the nature of the microstructure of metals and the alloys directly with their important physical and chemical properties. The metal specimen for TEM has to be delicately prepared in order to make it thin enough to let the electron transmit through.…”
Section: Electron Microscopementioning
confidence: 99%
See 1 more Smart Citation
“…It produces the images by probing the specimen with a focused electron beam which scans across a rectangular area on top of the sample surface, and it has been vastly applied to characterising the nanometre surface morphology. [137][138][139][140] TEM has become a key tool to correlate the nature of the microstructure of metals and the alloys directly with their important physical and chemical properties. The metal specimen for TEM has to be delicately prepared in order to make it thin enough to let the electron transmit through.…”
Section: Electron Microscopementioning
confidence: 99%
“…It produces the images by probing the specimen with a focused electron beam which scans across a rectangular area on top of the sample surface, and it has been vastly applied to characterising the nanometre surface morphology. 137 138 139 140…”
Section: Electropolishing Evaluation With Microscopementioning
confidence: 99%
“…More recent techniques to measure charge dynamics in polymer materials have used a scanning electron microscope, which delivers a non-penetrating electron beam, and a time-resolved current measuring mechanism [9]. These techniques use methods such as pressure wave propagation [10][11][12], pulsed electro-acoustic methods [13][14][15] and mirror image methods [16][17][18][19][20]. The effects of charge accumulation are monitored via a measured current as the sample is irradiated (and so charged) until the accumulated charge reaches an asymptotic steady state.…”
Section: Introductionmentioning
confidence: 99%
“…The boundary condition for the transformed electric field at the free end of the sample must satisfy equation (4. 19), hence we have…”
mentioning
confidence: 96%
“…In recent years, many experimental techniques have been proposed to measure space charge and its distribution in insulators [4]. The most popular and well developed methods include the pressure wave propagation (PWP) method [5][6][7], the pulsed electroacoustic (PEA) method [8][9][10] and the mirror image method (MIM) [11][12][13][14][15]. These methods have been successfully applied to the samples of polymethylmethacrylate (PMMA) [16], polyethylene (PE) [17], polyfluoroethylenepropylene (Teflon TM FEP) [18], polyimide (Kapton TM PI) [19] and polypropylene (PP) [20] etc.…”
Section: Introductionmentioning
confidence: 99%