Proceedings of the 41st SICE Annual Conference. SICE 2002.
DOI: 10.1109/sice.2002.1195721
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Analysis of the wavelet-based image difference algorithm for PCB inspection

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Cited by 22 publications
(9 citation statements)
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“…Above explained method can be combined with wavelets with reduced pixel value of image to detect the defects [9], [lO].…”
Section: Image Subtraction Methodsmentioning
confidence: 99%
“…Above explained method can be combined with wavelets with reduced pixel value of image to detect the defects [9], [lO].…”
Section: Image Subtraction Methodsmentioning
confidence: 99%
“…As the linear independence of {φ k,n :n∈Z}and {ψ k,n :n∈Z},and the mutually orthogonalV j ∩W j , according to (8), (12),…”
Section: Principle Of Multiresolution Analysismentioning
confidence: 99%
“…Wu [1] used image subtraction in binary mode for defect detection, and they applied an elimination process in order to distinguish true defects. Ibrahim [2] and AlAttas [3] applied image subtraction in the wavelet-domain image instead of a binary image. This method is well known as a wafer defect detection method since it is very simple and fast.…”
Section: Previous Workmentioning
confidence: 99%