Analysis of times-to-failure of various turn insulations of form-wound coils under PWM voltage waveform

Moonesan, Mohammad Saleh; Jayaram, S.; Cherney, E.A.; Omranipour, R.; Haq, Saeed Ul

doi:10.1109/eic.2013.6554230

Cited by 4 publications

(4 citation statements)

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“…It is, therefore, clear that the equation passes in classical Büssing's relationship, see Equation (7). It is clear that the results of partial degradation mechanisms in a logarithmic scale, before reaching the limits of the influence of the degradation factor, are exponential in nature.…”

Section: Model Suggestionmentioning

confidence: 96%

“…The Weibull distribution is commonly used on electric insulation data [1,7,8], e.g., times to failure in the case of the electrical aging test. The limitation of the statistical approach is that it provides the probability of object failure only when sufficient statistical data is available and is of the same degradation in the case of the test.…”

Section: Example Of Statistical Accessmentioning

confidence: 99%

“…When this "state" is exceeded, other degradation mechanisms operate differently than described by Equation (7). Limit states are consequently characterized by temperature limits TT1 up to TTn and partial activation energies Ea1 to Ean.…”

Section: Model Suggestionmentioning

confidence: 99%

“…The degradation of the insulation system is dependent on the understanding of the physicochemical processes and on the mathematical description of the aging macroscopic parameters or empirical constants commonly used in aging models. Sometimes, statistics [7][8][9] are used to estimate the mean time to failure (MTTF), etc. However, a more concrete model of aging can be designed when all degradation processes are fully understood.…”

Section: Introductionmentioning

confidence: 99%

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Proposal of Physical-Statistical Model of Thermal Aging Respecting Threshold Value

Soucek¹,

Trnka

Hornak

2017

Energies

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Abstract:The aging of electrical insulation material or a system is a main issue for designers of high-voltage (HV) machines. Precise determination of the life cycle of electrical insulation is one way of improving the efficiency of electrical machines involved in the production and transmission of electrical energy. Much effort has been devoted to preparing statistical or physical methods of Electrical Insulating System (EIS) life time estimation in the real operation of electrical machinery. The main aim of this paper is to introduce a new physical-statistical model of thermal aging respecting the threshold value. This model is based on thermal aging model and the main difference between this model and previously published models is taking into account the threshold value of degradation factor. The complete design of this model is presented in this paper, including functions defining the threshold value of the effect of the degradation factor depending on the temperature. Proposed model was verified by accelerated thermal aging test at selected temperatures (160, 170, 180 • C) and time intervals (0, 120, 240 h) on a commonly used transformer board. The breakdown voltage was set as an indicating parameter of the level of thermal aging and was measured according to standard IEC 60243-1. Collected data from these measurements were used for threshold value determination (431.23 K) and verification of proposed physical-statistical model of thermal aging respecting the threshold value.

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Section: Model Suggestionmentioning

confidence: 96%

Section: Example Of Statistical Accessmentioning

confidence: 99%

Section: Model Suggestionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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