Analysis of Total-Dose Response of A Bipolar Voltage Comparator Combining Radiation Experiments And Design Data

Bernard,; Boch, J.; Vaille,; Saigne,; Schrimpf,; Lorfevre,; David, Éric; Dusseau,

doi:10.1109/radecs.2005.4365597

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Cited by 11 publications

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“…Paper [4] studied the degradation of bias current and output voltage influenced by radiation. Paper [5] discussed the degradation of a voltage comparator by analyze bias current variation. Nevertheless, such of these present studies did not investigate the degradation mechanism from circuit level.…”

Section: Introductionmentioning

confidence: 99%

Variation of offset voltage in the irradiated bipolar voltage comparators

Liu

Cheng

et al. 2014

2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS)

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Total ionizing dose (TID) radiation effects in the bipolar voltage comparator with different biases and dose rates were investigated in this paper. The experimental results show that offset voltages shift after irradiation. Dominated by the current gain degradation of differential PNP transistors, the shifts of offset voltage and output characteristics were significantly affected by biases at high dose rate. Dominated by the current gain degradation of NPN transistors, the shifts of offset voltage and output characteristics were similar in all biases at low dose rate.

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Section: Introductionmentioning

confidence: 99%