Analysis of Unclamped-Inductive-Switching Failure for P-GaN Gate HEMT and Protection Schemes

Pan, Chengwu; Gu, Yong; Liu, Peigang; Jie, Ma; Zhang, Long; Liu, Siyang; Sun, Weifeng

doi:10.1109/icsict55466.2022.9963411

2022 IEEE 16th International Conference on Solid-State &Amp; Integrated Circuit Technology (ICSICT) 2022

DOI: 10.1109/icsict55466.2022.9963411

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Analysis of Unclamped-Inductive-Switching Failure for P-GaN Gate HEMT and Protection Schemes

Chengwu Pan

Yong Gu

Peigang Liu

et al.

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Analysis of Unclamped-Inductive-Switching Failure for P-GaN Gate HEMT and Protection Schemes

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