Analysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution

Takeuchi, T.; Tatsumura, Kosuke; Shimura, Takayoshi; Ohdomari, Iwao

doi:10.1016/j.tsf.2016.05.047

Cited by 1 publication

(2 citation statements)

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“…6(a) and 6(b), respectively. Similar peak-shape fits have been reported for nanowires (Takeuchi et al, 2016) and -particles (Cervellino et al, 2003;Masadeh et al, 2007). Since the residuals showed 0.06-0.07 (Cervellino et al, 2003) and 0.09-0.27 (Masadeh et al, 2007) for the particles, the value of our R min (0.13) is in a suitable range even though the systems are different.…”

Section: D Gaussian Fit For An Equivalent and Homogeneous Systemsupporting

confidence: 83%

“…A Gaussian fit is a conventional and useful spot-shape fitting method which can be used for XRD analysis of nanoparticles and -wires (Cervellino et al, 2003;Takeuchi et al, 2016). Firstly, we performed a fit of the measured peak shapes by a 1D Gaussian function with a homogeneous strain and domain size for the 041 and 042 spots in the 2D RSM, instead of the classical peak-center and broadening analyses.…”

Section: D Gaussian Fit For An Equivalent and Homogeneous Systemmentioning

confidence: 99%

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Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm

et al. 2019

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New fitting analyses for peak shapes in a 2D reciprocal-space map are demonstrated to evaluate the strain, strain distribution and domain size of a crystalline ultra-thin (15 Å ) film of -FeSi 2 (100) grown epitaxially on an Si(001) substrate, using grazing-incidence X-ray diffraction. A 2D Laue-fit analysis taking into account instrument broadening and the double-domain effect provides residual maps as a function of the inequivalent strains " b and " c along the b and c axes of -FeSi 2 , respectively (and domain size D), reflecting the probability of existence of homogeneous domains with fixed " b , " c and D, in addition to the most probable minimum residual. A 2D Laue fit with an inhomogeneous domain distribution provides a population map with " b and " c , reflecting strain components contributing to the film. The population map also leads to a reference residual as a guide for the strains contributing to the residual map. The advantages of the 2D Laue fits are discussed by comparison with the Scherrer, Williamson-Hall and Gaussian fitting methods for equivalent systems. The analyzed results indicate that the -FeSi 2 nanofilm was considerably small strained, which was also confirmed by transmission electron microscopy, implying a weak interface interaction between the film and the substrate.

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Section: D Gaussian Fit For An Equivalent and Homogeneous Systemsupporting

confidence: 83%

Section: D Gaussian Fit For An Equivalent and Homogeneous Systemmentioning

confidence: 99%

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm

et al. 2019

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Analysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution

Cited by 1 publication

References 16 publications

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm

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Analysis of X-ray diffraction curves of trapezoidal Si nanowires with a strain distribution

Cited by 1 publication

References 16 publications

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi2 nanofilm

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi2 nanofilm

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Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm

Shape-fitting analyses of two-dimensional X-ray diffraction spots for strain-distribution evaluation in a β-FeSi₂ nanofilm