1996
DOI: 10.1007/bf02995502
|View full text |Cite
|
Sign up to set email alerts
|

Analytic investigation of frequency sensitivity in microwave oscillators: Application to the computation of phase noise in a dielectric resonator oscillator

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

1996
1996
2006
2006

Publication Types

Select...
4
1

Relationship

0
5

Authors

Journals

citations
Cited by 23 publications
(1 citation statement)
references
References 11 publications
0
1
0
Order By: Relevance
“…As the phase noise of an oscillator close to the carrier is mainly determined by the conversion of the transistor's low frequency noise sources through its nonlinear elements, V EB and V CE nonlinearities have been considered for bipolar devices. From a previous work [1], it has been found that emitter-base V EB fluctuations mainly influence the phase noise.…”
Section: Hbt Optimum Biasingmentioning
confidence: 96%
“…As the phase noise of an oscillator close to the carrier is mainly determined by the conversion of the transistor's low frequency noise sources through its nonlinear elements, V EB and V CE nonlinearities have been considered for bipolar devices. From a previous work [1], it has been found that emitter-base V EB fluctuations mainly influence the phase noise.…”
Section: Hbt Optimum Biasingmentioning
confidence: 96%