1994
DOI: 10.1002/xrs.1300230503
|View full text |Cite
|
Sign up to set email alerts
|

Analytical electron microscopy of thin segregated layers

Abstract: Analytical convolution methods used to explain the interaction of a fine electron beam with a thin segregated layer in a typical electron microscope specimen are described. Expressions are derived which quantify the shape of the measured concentration profile determined in the microscope by scanning the beam acrass the segregated layer. The expression contains parameters concerned with the beam profile and the thickness of the segregated layer. The method is applied to grain boundary segregation studies of neu… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
5
0

Year Published

2004
2004
2018
2018

Publication Types

Select...
6
1

Relationship

0
7

Authors

Journals

citations
Cited by 21 publications
(5 citation statements)
references
References 6 publications
0
5
0
Order By: Relevance
“…6 and 7, respectively. Here, the experimental data are corrected according to an analytical convolution method established by Faulkner et al [16] because the actual segregated solute grain boundary concentration should be much higher or lower in the case of enrichment or depletion than those determined by the FEGTEM microanalysis because of its limited spatial resolution. The calculated results show a good agreement with experimental data when the change of FMD population B in the presence of Hf is considered.…”
Section: Resultsmentioning
confidence: 99%
“…6 and 7, respectively. Here, the experimental data are corrected according to an analytical convolution method established by Faulkner et al [16] because the actual segregated solute grain boundary concentration should be much higher or lower in the case of enrichment or depletion than those determined by the FEGTEM microanalysis because of its limited spatial resolution. The calculated results show a good agreement with experimental data when the change of FMD population B in the presence of Hf is considered.…”
Section: Resultsmentioning
confidence: 99%
“…However, as the special resolution of FEGSTEM-EDS (often greater than 2 nm [15]) rarely approximates the grain boundary thickness (less than 1 nm [16]), the measured result should be a convolution value of the actual compositional distribution near the grain boundary. For this reason, the measured results were corrected by a convolution method and the details of the correction for the measured values can be seen elsewhere [17][18][19].…”
Section: Methodsmentioning
confidence: 99%
“…(less than 1 nm [16]), the measured result should be a convolution value of the actual compositional distribution near the grain boundary. For this reason, the measured results were corrected by a convolution method and the details of the correction for the measured values can be seen elsewhere [17][18][19]. The fracture appearance transition temperatures (FATTs) of the HAZs were determined by Charpy impact tests combined with fracture appearance observations with the use of scanning electron microscopy (SEM, HITACHI S4700, Tokyo, Japan).…”
Section: Methodsmentioning
confidence: 99%
“…It is noted that earlier studies [8] on these weldments emphasized solute segregation effects, which were quantified at interfaces using a Vacuum Generators HB501 field emission scanning electron microscope (FEGSTEM) to provide high resolution solute concentration profiles [12]. These earlier data are referred to in the present paper.…”
Section: Methodsmentioning
confidence: 98%