Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy

Brennan, Michael; Howard, Michael; Marzouk, Youssef; Dresselhaus-Marais, Leora E.

doi:10.1007/s10853-022-07465-5

Cited by 4 publications

(2 citation statements)

References 26 publications

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“…fracture, radiation damage), a crystal grain with sufficiently well-understood defect structures may be measured in real-time, using simulations of all possible defect structures to evaluate the image features appearing in DFXM images collected at only a single crystal orientation. This may be done manually 19 , or using Bayesian inference for physics-informed image interpretation 46 .…”

Section: Resultsmentioning

confidence: 99%

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Dresselhaus-Marais,

Kozioziemski,

Holstad

et al. 2023

Sci Rep

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The structures, strain fields, and defect distributions in solid materials underlie the mechanical and physical properties across numerous applications. Many modern microstructural microscopy tools characterize crystal grains, domains and defects required to map lattice distortions or deformation, but are limited to studies of the (near) surface. Generally speaking, such tools cannot probe the structural dynamics in a way that is representative of bulk behavior. Synchrotron X-ray diffraction based imaging has long mapped the deeply embedded structural elements, and with enhanced resolution, dark field X-ray microscopy (DFXM) can now map those features with the requisite nm-resolution. However, these techniques still suffer from the required integration times due to limitations from the source and optics. This work extends DFXM to X-ray free electron lasers, showing how the $$10^{12}$$ 10 12 photons per pulse available at these sources offer structural characterization down to 100 fs resolution (orders of magnitude faster than current synchrotron images). We introduce the XFEL DFXM setup with simultaneous bright field microscopy to probe density changes within the same volume. This work presents a comprehensive guide to the multi-modal ultrafast high-resolution X-ray microscope that we constructed and tested at two XFELs, and shows initial data demonstrating two timing strategies to study associated reversible or irreversible lattice dynamics.

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Section: Resultsmentioning

confidence: 99%

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Dresselhaus-Marais,

Kozioziemski,

Holstad

et al. 2023

Sci Rep

Self Cite

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“…Development is in progress for the automatic tracking of mobile dislocations in time sequences (Gonzalez et al, 2020). Bayesian inference methods can be used to improve the accuracy of the dislocation core position to $ 5 nm (Brennan et al, 2022). Due to the long range of strain fields from dislocations, these techniques are directly applicable to classical diffraction topography and rocking curve imaging.…”

Section: Future Evolutionmentioning

confidence: 99%

darfix – data analysis for dark-field X-ray microscopy

Ferrer¹,

Rodríguez-Lamas²,

Payno³

et al. 2023

J Synchrotron Rad

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A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. DFXM is a non-destructive diffraction imaging technique that provides three-dimensional maps of lattice strain and orientation. The darfix package enables fast processing and visualization of these data, providing the user with the essential tools to extract information from the acquired images in a fast and intuitive manner. These data processing and visualization tools can be either imported as library components or accessed through a graphical user interface as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files' metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

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Extensive 3D mapping of dislocation structures in bulk aluminum

Yildirim

Poulsen

Winther

et al. 2023

Sci Rep

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Thermomechanical processing such as annealing is one of the main methods to tailor the mechanical properties of materials, however, much is unknown about the reorganization of dislocation structures deep inside macroscopic crystals that give rise to those changes. Here, we demonstrate the self-organization of dislocation structures upon high-temperature annealing in a mm-sized single crystal of aluminum. We map a large embedded 3D volume ($$100\times 300\times 300$$ 100 × 300 × 300 $$\upmu$$ μ m$$^3$$ 3 ) of dislocation structures using dark field X-ray microscopy (DFXM), a diffraction-based imaging technique. Over the wide field of view, DFXM’s high angular resolution allows us to identify subgrains, separated by dislocation boundaries, which we identify and characterize down to the single-dislocation level using computer-vision methods. We demonstrate how even after long annealing times at high temperatures, the remaining low density of dislocations still pack into well-defined, straight dislocation boundaries (DBs) that lie on specific crystallographic planes. In contrast to conventional grain growth models, our results show that the dihedral angles at the triple junctions are not the predicted 120$$^{\circ }$$ ∘ , suggesting additional complexities in the boundary stabilization mechanisms. Mapping the local misorientation and lattice strain around these boundaries shows that the observed strain is shear, imparting an average misorientation around the DB of $$\approx$$ ≈ 0.003 to 0.006$$^{\circ }$$ ∘ .

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Analytical methods for superresolution dislocation identification in dark-field X-ray microscopy

Cited by 4 publications

References 26 publications

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers

darfix – data analysis for dark-field X-ray microscopy

Extensive 3D mapping of dislocation structures in bulk aluminum

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