2006
DOI: 10.1109/lpt.2006.873567
|View full text |Cite
|
Sign up to set email alerts
|

Analytical modeling of a high-performance near-ballistic uni-traveling-carrier photodiode at a 1.55-/spl mu/m wavelength

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

1
26
0

Year Published

2007
2007
2024
2024

Publication Types

Select...
7
1

Relationship

1
7

Authors

Journals

citations
Cited by 50 publications
(28 citation statements)
references
References 11 publications
1
26
0
Order By: Relevance
“…There are two major factors limiting the bandwidth of our device; one is the internal carrier drift or lifetime, and the other is the RC time constant. Next, we use device-modeling techniques [9] to determine which one leads to the observed bandwidth enhancement and degradation under medium (6 V) and high (> 6 V) bias voltages. We utilize the measured microwave scattering parameters (S 11 ) to extract the RC-limited bandwidth, which is around 2 GHz and insensitive to the V CE bias (4-9 V).…”
Section: Measurement Resultsmentioning
confidence: 99%
“…There are two major factors limiting the bandwidth of our device; one is the internal carrier drift or lifetime, and the other is the RC time constant. Next, we use device-modeling techniques [9] to determine which one leads to the observed bandwidth enhancement and degradation under medium (6 V) and high (> 6 V) bias voltages. We utilize the measured microwave scattering parameters (S 11 ) to extract the RC-limited bandwidth, which is around 2 GHz and insensitive to the V CE bias (4-9 V).…”
Section: Measurement Resultsmentioning
confidence: 99%
“…However, during photodiode operation, photogenerated holes with slow drift velocity are always a major factor limiting speed. The 'slow' hole problem is eliminated in the InP-based UTC photodiode structure [ Normalized to spiral antenna output UTC (NBUTC) photodiodes [56][57][58][72][73][74], where only electrons with high drift velocity act as active carriers. Figure 6 shows conceptual band diagrams for p-i-n, UTC and NBUTC photodiodes.…”
Section: Millimeter-wave Photonic Transmittersmentioning
confidence: 99%
“…This leads to a significant improvement in the effective carrier drift velocity of the photodiode during operation and excellent SCBP performance [28,70,71]. The major difference between the UTC photodiode and the NBUTC photodiode is the insertion of an additional p-type charge layer in the collector layer to control the distribution of the internal electrical field, which results in an over-shoot of the electron drift velocity even under high reverse bias voltage (-3 V) [56][57][58][71][72][73][74]. Figure 6(c) shows a conceptual band diagram for an NBUTC photodiode.…”
Section: Millimeter-wave Photonic Transmittersmentioning
confidence: 99%
“…13b,d,e, the i-InP carrier collection layer can be replaced with a dopedInP in order to avoid the space charge effect, and to accelerate electrons by near-ballistic (NB) transport behavior [60,61]. The former is sometimes called as chargecompensated (CC) structure [62].…”
Section: Carrier Transport Designmentioning
confidence: 99%