2015
DOI: 10.1016/b978-0-08-099948-7.00004-x
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Analytical Transmission Electron Microscopy and Scanning Transmission Electron Microscopy Techniques for the Characterization of Nanomaterial Composition, Phase and Crystallinity

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Cited by 8 publications
(7 citation statements)
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“…Individual clay platelets are only a few nanometers thick. However, once they form stacks and patches, clay platelets produce thicker sample regions for TEM analysis, which result in relatively dark contrast on those images [ 57 ]. It is also worth mentioning that dehydration of hydrated structures of clay minerals in the TEM vacuum or electron beam damage may occur during the TEM analysis, producing artifacts in the results [ 57 ].…”
Section: Resultsmentioning
confidence: 99%
“…Individual clay platelets are only a few nanometers thick. However, once they form stacks and patches, clay platelets produce thicker sample regions for TEM analysis, which result in relatively dark contrast on those images [ 57 ]. It is also worth mentioning that dehydration of hydrated structures of clay minerals in the TEM vacuum or electron beam damage may occur during the TEM analysis, producing artifacts in the results [ 57 ].…”
Section: Resultsmentioning
confidence: 99%
“…Radiolysis involves the ionization of sample atoms during inelastic scattering and breaks chemical bonds, resulting in the formation of defects, including amorphization, sputtering atoms from the surfaces. 22 However, compared to conventional oxide perovskites, halide perovskites are less stable under electron beam irradiation. Their nanostructures are intractable to be characterized using TEM due to the instability to high-energy electron beams.…”
Section: Introductionmentioning
confidence: 99%
“…As illustrated in Figure a, knock-on displacement involves the transfer of momentum from incident electrons to sample atoms during high-angle electron scattering, resulting in the displacement of internal atoms (especially those with low Z ). Radiolysis involves the ionization of sample atoms during inelastic scattering and breaks chemical bonds, resulting in the formation of defects, including amorphization, sputtering atoms from the surfaces …”
Section: Introductionmentioning
confidence: 99%
“…Atomic-resolution scanning transmission electron microscopy (STEM) uses a scanning beam mode that can be focused to a diameter as small as 0.1 nm by condenser lenses, which means that STEM can achieve the finest possible probe size of 0.5 Å with the maximum current available. 161 This merit allows for atomic scale resolution in imaging and chemical analysis of heteroatom-doped carbons. The STEM images are formed by filtering the scattered electrons over a certain angular range of the diffracted beam, which usually allows differentiation between bright-field (BF) and dark-field (DF) imaging modes.…”
Section: Characterization Of Heteroatom-doped Porous Carbonsmentioning
confidence: 99%