A rapid x-ray fluorescence (XRF) method for the quantitative analysis of uranium i n ore and process samples i s demonstrated. The method requires no uranium ore standar.ds and provides a relative precision of 22.5%. Particl e-size and sel f-absorption effects are eval uated a1 ong wi t h current methods of exci t a t i on and detection for M, L, and K series uranium x-rays. Sensitivities and detection 1 imi t s are comparable using either energy dispersive or wavelength dispersive analysis of uranium L x-rays, and wavelength dispersive analysis of uranium M x-rays f o r both thick and t h i n samples. The XRF methods are more sensitive than the analysis of uranium by F52cf neutron-induced y-ray analysis o r by direct photon analysis of urani um daughters.