Proceedings of the 25th Edition on Great Lakes Symposium on VLSI 2015
DOI: 10.1145/2742060.2742096
|View full text |Cite
|
Sign up to set email alerts
|

Analyzing the Dark Silicon Phenomenon in a Many-Core Chip Multi-Processor under Deeply-Scaled Process Technologies

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2015
2015
2021
2021

Publication Types

Select...
2
1
1

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 13 publications
0
1
0
Order By: Relevance
“…Dark silicon has emerged as a design challenge in the nanometer regime. Several design techniques to circumvent the dark silicon issues have been elaborated upon in [20,21].…”
Section: Related Workmentioning
confidence: 99%
“…Dark silicon has emerged as a design challenge in the nanometer regime. Several design techniques to circumvent the dark silicon issues have been elaborated upon in [20,21].…”
Section: Related Workmentioning
confidence: 99%