2013
DOI: 10.1016/j.cj.2013.07.012
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Anatomical and chemical characteristics associated with lodging resistance in wheat

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Cited by 174 publications
(173 citation statements)
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“…Kelbert et al (2004a) observed considerable differences in stem wall thickness in the second internode region between common wheat cultivars that are resistant and sensitive to lodging (0.75 mm and 0.69 mm, respectively). Similar results were reported in a study of four common wheat genotypes, where a positive correlation was noted between lodging resistance vs. stem wall thickness (R = 0.972) and the weight of three lowest internodes (R = 0.986) (Kong et al, 2013). A trait that was particularly correlated with lodging resistance was mechanical layer thickness (R = 1.000).…”
Section: Discussionsupporting
confidence: 73%
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“…Kelbert et al (2004a) observed considerable differences in stem wall thickness in the second internode region between common wheat cultivars that are resistant and sensitive to lodging (0.75 mm and 0.69 mm, respectively). Similar results were reported in a study of four common wheat genotypes, where a positive correlation was noted between lodging resistance vs. stem wall thickness (R = 0.972) and the weight of three lowest internodes (R = 0.986) (Kong et al, 2013). A trait that was particularly correlated with lodging resistance was mechanical layer thickness (R = 1.000).…”
Section: Discussionsupporting
confidence: 73%
“…In common wheat, resistance to lodging is highly correlated with plant height as well as stem diameter, stem wall thickness, mechanical layer thickness, and area of transverse section (Kelbert et al, 2004a;Kong et al, 2013;Wang et al, 2006;Zuber et al, 1999). Higher values of the above traits are indicative of increased resistance to lodging.…”
Section: Discussionmentioning
confidence: 96%
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