Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers

Aarnink, W.A.M.; Weishaupt, A.; Silfhout, A. van

doi:10.1016/0169-4332(90)90018-u

Cited by 135 publications

(63 citation statements)

References 24 publications

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“…The measured function G(a) was close to that obtained on a clean sputtered Si sample [15]. The thickness of the contamination layer on the sheet and the single crystal of tungsten has been measured.…”

Section: Arx P S Measurementsmentioning

confidence: 51%

“…In this method the same XPS peak is measured at varying photoelectron take-off angle and its intensity is normalized to the normal take-off angle. For the intensity of the XPS peak of tungsten, measured at different electron take-off angles (00 and normalized to its intensity at normal take-off angle (0t = 0), we may write [15]:…”

Section: Arx P S Measurementsmentioning

confidence: 99%

“…We have applied "absolute" ARXPS measurements described lately by Aarnink et al [15]. In this method the same XPS peak is measured at varying photoelectron take-off angle and its intensity is normalized to the normal take-off angle.…”

Section: Arx P S Measurementsmentioning

confidence: 99%

“…Non-destructive ARXPS method is used often to study the thickness of the outermost top layer of solid materials [15]. We have applied "absolute" ARXPS measurements described lately by Aarnink et al [15].…”

Section: Arx P S Measurementsmentioning

confidence: 99%

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Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

et al. 1992

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Abstract. The combination of Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and angle resolved X-ray photoelectron spectroscopy (ARXPS) has been applied to the analysis of the distribution of elements at the surface region of electrochemically etched tungsten tips and the determination of the thickness of a layer with oxygen and carbon contamination. Auger line profiling revealed a homogeneous distribution of oxygen and significant enrichment of carbon on the W tip between 0 and 1.5/~m from the top. The thickness of the contamination layer on various W materials, electrochemically etched, was found to be 1.35 __+ 0.15 nm as measured using ARXPS, and was estimated to be about 1-3 nm as measured by AES.Key words: AES, sputtering, STM, XPS.One of the important aspects of scanning tunneling microscopy (STM) operation is the reliable formation of tunneling probe tips. Characterization of the surface contaminations on STM tips is helpful for a preliminary selection of good performance tips [1]. It is well known, that the oxides and graphite layers can influence the tunneling current by changing the effective resistance of tip surface layer I-2, 3]. In the light of these results it was interesting to investigate the thickness of these layers.Transmission electron microscopy (TEM) studies indicated that the most widely applied tungsten tips, prepared by electrochemical etching, were covered by thin (1-5 nm thick) polycrystalline tungsten oxides 1-3, 4] and carbon or graphite [1][2][3][4][5]

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Section: Arx P S Measurementsmentioning

confidence: 51%

Section: Arx P S Measurementsmentioning

confidence: 99%

Section: Arx P S Measurementsmentioning

confidence: 99%

Section: Arx P S Measurementsmentioning

confidence: 99%

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Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

et al. 1992

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“…With a model we proposed earlier, we showed that ARXPS experiments enable us to determine the thickness of a surface layer with great accuracy [21]. In this report in section 2, we improve this model so that it can be used for the quantitative analy:is of ARXPS spectra, taken on c-axis oriented high-To 0169-4332/92/$05.…”

Section: Introductionmentioning

confidence: 99%

Quantitative analysis of X-ray photoemission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7−δ thin films

Aarnink

Gao

Rogalla

et al. 1992

Applied Surface Science

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Angle-resolved X-ray photoemission spectroscopy (ARXPS) was performed on c-axis oriented high-T~ superconducting YBa,Cu30 , ~ thin films. The layered structure of the YBa2Cu30 7 ~ films was used to develop a model for the quantitative analysis of the ARXPS experiments. Our XPS results may be compared to spectra taken on YBazCu30 7_~ single-crystal surfaces. On the spectra features are superposed that are assigned to a thin non-superconducting surface layer. For the first time. relative ARXPS measurements show that the interface between the superconducting YBa,Cu3OT_,~ film and the surface layer is formed by the atomic Y layer. The surface layer consists mainly of BaCO~ and C. A small volume fraction ( ~ 20%) contains Ba-and Cu-oxides. probably in the form of BaCuO 2. From absolute ARXPS measurements, the thickness of the surface layer was calculated to be 11.93 + 11.06 nm. It is shown that the surface roughness of our films is on the order of 0.6 rim. A good agreement between theory and experiment has been found in this report.

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A One‐Pot Universal Approach to Fabricate Lubricant‐Infused Slippery Surfaces on Solid Substrates

Tesler

Prado

Khusniyarov

et al. 2021

Adv Funct Materials

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Wetting is a surface phenomenon that commonly occurs in nature and has an enormous influence on human life. Slippery liquid‐infused porous surfaces have recently been developed to support the growing demand for anti‐fouling coatings. While short‐chain fluorinated compounds, commonly used to reduce the surface energy of substrates, are banned due to environmental toxicity, silane‐based compounds are expensive and barely scalable. In this sense, silicone‐based chemistry may match the gap as a real alternative. However, the grafting approaches demonstrated so far suffered from either slow binding kinetics or are applied under harsh conditions. Here, it is demonstrated that polydimethylsiloxanes graft to virtually any substrate when illuminated by UV light serving simultaneously as a reducing surface energy agent and infusing lubricant. This procedure is applied on metals, metal oxides, and ceramics of various surface morphologies. The proposed approach is simple, fast, scalable, environmentally friendly, and of low‐cost, yet forms stable lubricant‐infused slippery surfaces by a one‐pot process. Due to the biocompatibility of silicone‐based compounds, the process is examined on plain medically applicable substrates such as scalpel blades and glass lenses that display enhanced corrosion resistance, reduced friction through incision, and repel blood staining and bacterial adhesion without deteriorating their mechanical and optical characteristics.

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Angle-resolved X-ray photoelectron spectroscopy (ARXPS) and a modified Levenberg-Marquardt fit procedure: a new combination for modeling thin layers

Cited by 135 publications

References 24 publications

Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

Distribution and thickness of the surface contaminations on STM tungsten tips, studied by AES/SEM and ARXPS

Quantitative analysis of X-ray photoemission spectra, acquired on c-axis oriented high-Tc superconducting YBa2Cu3O7−δ thin films

A One‐Pot Universal Approach to Fabricate Lubricant‐Infused Slippery Surfaces on Solid Substrates

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