“…The vibrational frequencies can also be computed by DFT, which complements the Raman analysis. Raman microscopy is a nondestructive, non-contact, and local (≈1m 2 lateral resolution [23]) technique that has been proved to be sensitive to Be stretching modes [24], beryllium oxide modes [25], bending and stretching tungsten oxide modes [26], Be x W y mixed samples density of states [27], Be-C-W irradiated samples [28], and give information when a pristine material is implanted by hydrogen ions [27,29,30]. First Raman analyses in ILW-tokamaks were performed on several molybdenum JET mirrors [27], showing that the technique is sensitive to thin (≈10 nm) deposited layer composed of ≈33% Be, ≈33% C and ≈33% O and to the underlying molybdenum oxidized mirror, the atomic percent being obtained by X-ray Photon spectroscopy (XPS).…”