Thermally stimulated current ͑TSC͒ spectroscopy and temperature-dependent dark current ͑DC͒ measurements have been applied to study traps and photoinduced persistent surface conduction in two hydrothermally grown bulk ZnO samples, as-grown, and annealed at 600°C in N 2 ambient for 30 min, respectively. The as-grown sample had a room-temperature ͑RT͒ resistivity of 1.6 ϫ 10 3 ⍀ cm, mobility of 2.1ϫ 10 2 cm 2 / V s, and carrier concentration of 1.8ϫ 10 13 cm −3 , while the annealed sample was highly resistive, with RT resistivity of 3.6ϫ 10 6 ⍀ cm, mobility of 4.4 cm 2 / V s, and carrier concentration of 3.9ϫ 10 11 cm −3 . The as-grown sample showed strong conduction at low temperatures, which has been shown to be due to near-surface carriers in other studies. The annealed sample did not demonstrate this phenomenon. The dominant trap in the as-grown sample had an activation energy of 0.16 eV, was strongest near the surface, and is possibly related to V Zn . In the annealed sample, however, the dominant trap had an activation energy of 0.22 eV, was of bulk nature, and is tentatively assigned to Li Zn . After several routine TSC measurements, the DC for the as-grown sample increased by more than one order of magnitude at low temperatures ͑T Ͻ 180 K͒, while for the annealed sample, the DC increased by a factor of 2 at high temperatures ͑T Ͼ 200 K͒. These effects are generated by the TSC trap-filling illumination and can persist for many days under vacuum. At RT, the DC in the annealed sample returns to its equilibrium state if the sample is vented to air.