1990
DOI: 10.1149/1.2086278
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Anisotropic Etching of Crystalline Silicon in Alkaline Solutions: II . Influence of Dopants

Abstract: The etching behavior of highly boron doped silicon in aqueous solutions based of ethylenediamine, KOH, NaOH, and LiOH was studied. For all etchants, a strong reduction of the etch rate for boron concentrations exceeding approximately 2 9 10 ~9 cm -3 was observed. This value is in good agreement with published data for the onset of degeneracy of p-type silicon. The reduction of the etch rate was found to be inversely proportional to the fourth power of the boron concentration.

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Cited by 455 publications
(425 citation statements)
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“…16 In the case of B-dopant, the etch rate reduction up to three orders of magnitude could be obtained for Si electrodes with increasing the boron concentration from 10 19 /cm 3 to 10 20 /cm 3 . 16,23 Although the etch rate reduction for highly doped Si electrodes in strongly acidic solutions was not observed, 16,24 we assume that EMIm(HF) 2.3 F ionic liquid shows similar behavior to alkaline media. Moreover, the chemical and electrochemical behavior of heavily-doped Si electrodes in EMIm(HF) 2.3 F ionic liquid are still unknown and more investigations are needed to understand the influence of dopant concentrations and crystal orientations of Si electrodes.…”
Section: Discussionmentioning
confidence: 98%
“…16 In the case of B-dopant, the etch rate reduction up to three orders of magnitude could be obtained for Si electrodes with increasing the boron concentration from 10 19 /cm 3 to 10 20 /cm 3 . 16,23 Although the etch rate reduction for highly doped Si electrodes in strongly acidic solutions was not observed, 16,24 we assume that EMIm(HF) 2.3 F ionic liquid shows similar behavior to alkaline media. Moreover, the chemical and electrochemical behavior of heavily-doped Si electrodes in EMIm(HF) 2.3 F ionic liquid are still unknown and more investigations are needed to understand the influence of dopant concentrations and crystal orientations of Si electrodes.…”
Section: Discussionmentioning
confidence: 98%
“…Therefore, our morphological design strategy can be applied to improve the fracture behavior not only of nanopillars or nanoparticles but also of c-Si structures of larger dimensions as long as bulk diffusion process is much faster than the interface reaction kinetics. Whereas synthesis of anisometric Si nanostructures may be accomplished through anisotropic crystal growth 41 or etching [42][43][44] , anisometric micron-sized Si structures such as micropillars can be more easily and precisely fabricated by conventional photolithography techniques. We recently prepared both p-type and n-type silicon micropillar arrays (diameter = 2 µm) with different cross section shapes on (100) Si wafers using plasma etching, and electrochemically lithiated them in lithium half cells 45 (details of the fabrication and electrochemical test methods can be found in the Supporting Information).…”
Section: Morphological Design Of C-si Anodementioning
confidence: 99%
“…The following discussion concerning the difference in the Cu collection efficiency on the p + -type silicon surface is based on the band model reported by Seidel et al 15 According to their band model, the width of the space-charge layer on the silicon surface is shrunk sharply because of a high concentration of boron. This leads to an equivalent narrowing of the potential well, which cannot confine the electrons injected into the conduction band by the oxidation step (Eq.…”
Section: Resultsmentioning
confidence: 99%