This paper presents the results from the investigation of the chemical anisotropic etching of single-crystal silicon <100>inthe following solutions: KOH (or NaOH, LiOHH20), K3[Fe(CN)6} 0. IM, K4Fe(CN)6] •3H20 0. IM, KNO3 0. 1M and/or complexant added. The complexants added in KOH solution were: Calix[4]arenes, Phenols and Ether Dibenzo 1 8 Crown 6.The results using also NaOH or LiOH•H20 and complexants are presented. The reaction mechanism and the hillocks formation and elimination are analysed. The results allow us to use the redox system and/or the organic complexants, to monitor the etching process, to obtain a smooth silicon surface, almost free of hillocks, to utilize the usual mask material resistant at the new etchants.