2015
DOI: 10.2465/jmps.150430
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Annealing effects on cathodoluminescence of zircon

Abstract: Color cathodoluminescence (CL) images of zircon from southern Malawi (MZ) show mottled yellow CL emissions on a dull luminescent background by the annealing below 600°C, and relatively homogeneous blue emissions above 800°C. CL spectroscopy of the samples reveals a change of the luminescent features with an annealing temperature, and explains a variation of their colors and luminance observed by a CL microscope. Emission bands at 310 and 380 nm in an ultraviolet (UV) to blue CL are assigned to intrinsic center… Show more

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Cited by 8 publications
(12 citation statements)
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“…This might be attributed to structural defect centers related to radiation-induced damage. According to Gaft et al (1998) and Finch et al (2004), the luminescence centers detected from IL and PL in a yellow region are assigned to structural defects referred from the SiO m n-groups and Frenkel-type defects, which were also confirmed by Tsuchiya et al (2015). The natural zircon (U: 241 ppm and Th: 177 ppm) from Malawi has two emission components at 1.97 eV and 2.20 eV in the yellow region (Tsuchiya et al, 2015), which are obtained by the deconvolution of remaining CL-spectral data after deduction of the emission components derived from the REEs such as Dy (Fig.…”
Section: Of He + Ion-implanted Synthetic Zirconmentioning
confidence: 79%
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“…This might be attributed to structural defect centers related to radiation-induced damage. According to Gaft et al (1998) and Finch et al (2004), the luminescence centers detected from IL and PL in a yellow region are assigned to structural defects referred from the SiO m n-groups and Frenkel-type defects, which were also confirmed by Tsuchiya et al (2015). The natural zircon (U: 241 ppm and Th: 177 ppm) from Malawi has two emission components at 1.97 eV and 2.20 eV in the yellow region (Tsuchiya et al, 2015), which are obtained by the deconvolution of remaining CL-spectral data after deduction of the emission components derived from the REEs such as Dy (Fig.…”
Section: Of He + Ion-implanted Synthetic Zirconmentioning
confidence: 79%
“…These components can be assigned to the "intrinsic" defect centers of a 3 , a 4 , a 5 and a 6 , respectively, as was proposed by Cesbron et al (1995). The same emission centers were recognized in annealed natural zircon with various degree of metamictization (Tsuchiya et al, 2015). According to Cesbron et al (1995) and Rémond et al (1995), the emission centers of a 1 to a 6 obtained in synthetic zircon are closely related to the structural defects in a host lattice associated with specified atomic-bonding formed during crystallization, so termed "intrinsic" defects.…”
Section: Of Synthetic Zirconmentioning
confidence: 79%
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