2018
DOI: 10.1038/s41598-018-23941-y
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Annealing induced atomic rearrangements on (Ga,In) (N,As) probed by hard X-ray photoelectron spectroscopy and X-ray absorption fine structure

Abstract: We study the effects of annealing on (Ga0.64,In0.36) (N0.045,As0.955) using hard X-ray photoelectron spectroscopy and X-ray absorption fine structure measurements. We observed surface oxidation and termination of the N-As bond defects caused by the annealing process. Specifically, we observed a characteristic chemical shift towards lower binding energies in the photoelectron spectra related to In. This phenomenon appears to be caused by the atomic arrangement, which produces increased In-N bond configurations … Show more

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Cited by 5 publications
(2 citation statements)
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“…However, some variation could be found in core-level spectra. This shows that the main XPS peaks (including Cs3d, W4f, and O1s) of annealed sample monotonously shift to lower binding energies probably due to further pyrolysis and increasing crystallinity [ 23 , 24 ]. Core-level XPS of the unannealed sample shows two spin–orbit doublets, W4f 7/2 and W4f 5/2 , peaked at 35.8 and 37.9 eV, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…However, some variation could be found in core-level spectra. This shows that the main XPS peaks (including Cs3d, W4f, and O1s) of annealed sample monotonously shift to lower binding energies probably due to further pyrolysis and increasing crystallinity [ 23 , 24 ]. Core-level XPS of the unannealed sample shows two spin–orbit doublets, W4f 7/2 and W4f 5/2 , peaked at 35.8 and 37.9 eV, respectively.…”
Section: Resultsmentioning
confidence: 99%
“…The newly generated binding energy peak of about 20 eV belongs to the Ga 3d peak with Ga─As (Figure 2e,h). Since BE (In─As) > BE (In─N) > BE (Indium), [20] the high binding energy displacement of the In 4d spectral peak represents the increase of In-As and the decrease of In─N and amorphous active indium clusters. Moreover, for the N 1s orbital, the peak center moved from 395 eV corresponding to N─In to 400 eV and it had been reported that 400 eV in the N 1s orbital corresponds to the N─As bond (Figure 2f,i).…”
Section: Anodic Reconstruction Characterizationmentioning
confidence: 99%