2004
DOI: 10.1016/j.jelechem.2004.02.009
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Anodic current transient for n-Si|SiO2 electrodes in HF solution: the relationship between the current and the interface structure

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Cited by 5 publications
(3 citation statements)
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“…[76] Another approach called metal assisted chemical etching (MACE) has been reported for the nanopores formation based on unique electrochemical properties of silicon wafer. [80][81][82][83] Tsujino and Matsunura reported that in HF and hydrogen peroxide (H 2 O 2 ) solvent combining the function of silver particle as a catalysis, the cylindrical nanoholes were formed. [82] They also reported in 2007 that the concentration of H 2 O 2 would affect the pore size and pore morphology also depended on the morphology of catalysis.…”
Section: Wet Etchingmentioning
confidence: 99%
“…[76] Another approach called metal assisted chemical etching (MACE) has been reported for the nanopores formation based on unique electrochemical properties of silicon wafer. [80][81][82][83] Tsujino and Matsunura reported that in HF and hydrogen peroxide (H 2 O 2 ) solvent combining the function of silver particle as a catalysis, the cylindrical nanoholes were formed. [82] They also reported in 2007 that the concentration of H 2 O 2 would affect the pore size and pore morphology also depended on the morphology of catalysis.…”
Section: Wet Etchingmentioning
confidence: 99%
“…A related current peak is observed when an oxidized surface is exposed to fluoride electrolyte. This phenomenon indicates electron injection by the intermediate states when oxide dissolution is nearly complete (56,58,59). In-situ infrared spectroscopy of the surface in the fluoride electrolyte indicates that the surface remains essentially hydrogenated in this potential range (60).…”
Section: Silicon In Fluoride Electrolytesmentioning
confidence: 99%
“…Then, at some time during the oscillation, the potential is stepped to a value close to OCP, and the current is monitored as a function of time. The recording exhibits a peak, which has been attributed to electron injection from dissolution intermediates at the end of the dissolution of the oxide (56,58,59). The delay at which the current peak occurs can then be taken as a qualitative indication of the oxide thickness at the time when the potential was stepped.…”
Section: Silicon In Fluoride Electrolytesmentioning
confidence: 99%