1985
DOI: 10.1103/physrevb.32.4258
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Anomalies in the low-temperature thermal and electrical resistivities of copper

Abstract: Accurate measurements of the low-temperature thermal conductivity of high-purity copper have revealed abrupt changes in the temperature dependence of the inelastic electron-phonon scattering component of the thermal resistivity ( 8'~) at about 7-, 11, and 18 K. The existence of these regions and the deviation of the form of the ratio p"/Wz (where p" is the normal electron-phonon scattering coniponent of the electrical resistivity) in the two lower regions from that in the two upper regions requires a reassessm… Show more

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Cited by 8 publications
(3 citation statements)
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“…Here, for the convenience of discussion, we consider thermal resistivity (W = 1/κ). For a pure metal, it can be given as 30,31,42 W W W W…”
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confidence: 99%
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“…Here, for the convenience of discussion, we consider thermal resistivity (W = 1/κ). For a pure metal, it can be given as 30,31,42 W W W W…”
mentioning
confidence: 99%
“…Fonteyn and Pitsi performed early experimental investigations on Cu in the low-temperature regime (0.5 < T < 3 K), but the torsion deformation was made only within a few percentages of strain. Later, Kos carried out experiments on low-temperature thermal and electrical transport of pure Cu and observed abrupt changes at 7, 11, and 18 K in the temperature dependence of the inelastic component of thermal resistivity ( W inelastic ), which is due to the vertical processes of inelastic electron–phonon scattering. The author also measured the low-temperature thermal conductivity of one deformed Cu sample that was strained by winding and compared it with the pristine sample to disclose the effect of dislocations .…”
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